Simultaneous measurement of Sheet & Hall resistance at high precision and extremely low noise
Coming soon.
New Tensormeter model RTM 2 will be presented at DPG conference in Regensburg, 6.-9. September 2022.
Follow Tensor Instruments CTO Dr. Tobias Kosub on a tour to
A new dimension of resistance measurements
Don’t hesitate to contact us:
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to discuss your challenges with your resistance measurements and how the Tensormeter could improve your results.
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to talk about, how your first sample could be explored with the Tensormeter, while you are attending the measurement live per video-conference (no fees).
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to find out how you can rent the Tensormeter to explore all its functions and features extensively in your lab.
Want to know how Tensormeter can improve your research?
How to achieve the best possible resistance measurements
Learn about noise reduction and device choices
The electrical resistance of materials is one of the properties that is most pervasive in modern applications ranging from nanoscale to megascale. Electrical resistance characterization is a simple, yet powerful tool in diverse fields from the research of new materials, over the qualification of new applications all the way to actual field operation.
To stay ahead of your competition, you want to make the best possible resistance measurements. This means: Get the most precise result in the shortest amount of time. But neither can measurements be infinitely accurate, nor infinitely fast. It is important to understand, which bottlenecks in your signal chain can be resolved and which physical limitations exist.
Tensormeter RTM1
A new dimension of resistance measurements
Tensormeter is designed for automated precision measurements of resistance and voltages. It unites the benefits of both Lock-in Amplifiers and Source/Measure Units through an innovative flexible architecture.
Want to know how Tensormeter can improve your research?
A single device
for a variety of applications.
Materials Research
Magnetic materials
2D materials
Spiontronic materials
Flexible electronics
Device characterization
High stability, no drift, no offset
Faster binning
Tighter specs
Integrated calibration
Unique Measurements
DC and AC simultaneously
van-der-Pauw, zero-offset Hall
Differential and ratiometric
Harmonic distortion
Pulse and measure
Your benefit
Simpler measurements. Better results.
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Measure Sheet & Hall resistance at high precision and extremly low noise.
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Measure irregularly shaped samples without need for lithographic patterning.
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Replace Lock-in Amplifier, Source/ Measure Unit, Digital Multimeter & Analog Matrix Switch.
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Save measuring time.
Achieve higher throughput.
Patented Development
The Tensormeter technology is a patented development of
Helmholtz-Zentrum Dresden-Rossendorf e.V.
